SEM (Scanning electron microscope) JSM-6510
The JEOL scanning electron microscope JSM-6510 allows measurement in secondary and backscattered electrons. The microscope operates in both high and low vacuum modes. The low vacuum mode allows observation of non-conductive samples without the need of coating the sample surface. An EDS SDD x-act detector 10mm2 INCA from Oxford Instruments is connected to the microscope, allowing the element’s detection from boron to plutonium. A WDS detector INCA WAVE WDS, allows measurements of trace amounts of elements in samples.
TEM (Transmission electron microscope) JEM-3010
contact: Ivo Jakubec
Transmission electron microscope is the only lab instrument which makes it possible to simultaneously obtain information about structure, elemental composition and morphology of particles from an area of several nanometers.
The Jeol transmission electron microscope allows study of atomic structure with atomic resolution, both in direct imaging (HRTEM) and electron diffraction (SAED, CBED, NBED). An EDX detector from Oxford Instruments is connected to the microscope for element analysis in nano resolution. The NanoMegas DigiStar is connected to the system and enables mapping of crystallographically different phases and crystal orientation on a nanometre scale.
Quantachrome Instruments NOVA 4200e
contact: Eva Pližingrová
Allow measurements of up to 3 samples simultaneously and determine the external surface surface area, micropore surface area, the total pore volume, and the average pore diameter. From a maximum of 100 points adsorption / desorption isotherms, the BJH pore size distribution can be determined. FloVac Degasser is used for pre-sample preparation in two modes, as vacuum degas up to 300 °C or flow degas.
TA-MS system Setaram SetSys Evolution coupled with quadrupole mass spectrometer QMG 700, Pfeiffer, by SuperSonic system, Setaram
Thermal analysis measurement can be performed on device SetSys Evolution, Setaram, coupled with quadrupole mass spectrometer QMG 700, Pfeiffer, by SuperSonic system, Setaram. Decomposition of samples can be both in inert or air atmosphere, in temperature range 30 – 1600 °C with various heating rates. Evolved gas analysis data can be collected in multiple ion detection mode (MID) as intensity of individual selected fragments or in scanning detection mode (SCAN).
HRSEM (high resolution scanning electron microscope) FEI NanoSEM 450
The FEI high resolution scanning electron microscope is suitable for measurements of makes it possible to measure the high-quality figures of shapes, morphology, defects or agglomerates of particles even on a nanometer scale. The observation is possible by the Everhart-Thornley detector or the low-vacuum (10-200 Pa) via the “through-the-Lens” mode. The sample can be tilted in the range of -15 to 75°. Voltage is selectable in the range of 1 – 30 kV. Thanks to the Field-Free mode, it is possible to measure and record magnetic samples. For even better resolution, it can be measured in immersion mode. The qualitative and quantitative determination of the present elements is provided by the present EDS detector, which also offers the possibility of graphical mapping of elemental representation.
Powder diffractometer PANalytical X‘PertPRO
contact: Petr Bezdička
The PANalytical X’Pert MPD (Multi Purpose Diffractometer) is equipped with a cobalt X-ray tube (CoK, 40 kV applied voltage, 30 mA current) and a fast linear position sensitive X’Celerator. If necessary, the Co-X-ray tube can be exchanged for Cu. In the basic version, the Bragg-Brentan diffractometer has a fixed divergence screen and a fixed anti-scatter screen. For high temperature X-ray powder diffraction, the instrument is equipped with an Anton Paar HTK-16 chamber, which allows analyzes up to approx. 1200 °C in air. Another advantage is the possibility of measuring so-called microdiffraction for angular range 4 to 80° 2theta.
Cooperation in project of Ministry of Education and Health NanoEnviCz:
contact: Petra Ecorchard
NanoEnviCz integrates the infrastructure facilities of Czech research organizations for research in nanotechnology sciences. The program is focused on research in the field of nanomaterials and nanocomposites for environmental and related applications. The services include controllable syntheses of nanomaterials, their complex chemical, structural, morphological and surface characterization, tuning their functional properties, monitoring their potential toxicity and hazard.
It is possible to use the network of six institutes in the Czech Republic, namely: J. Heyrovsky Institute of Physical Chemistry of the CAS, Institute of Experimental Medicine of the CAS, Institute of Inorganic Chemistry of the CAS,
University of J. E. Purkyně in Ústí nad Labem, Palacký University Olomouc and Technical University of Liberec.
In Institute of Inorganic Chemistry of the CAS following techniques can be used:
UACH1 – AFM
UACH2 – Photocatalytic degradation liquide phase
UACH4 – HRSEM FEI NanoSEM 450
UACH5 – Surface Area and Pore Size Analyzer (BET)
UACH7 – Gas chromatograph with Mass spectrometer
UACH8 – FTIR with DRIFT (diffuse reflectance monitoring) – Thermo Nicolet
UACH9 – DXR Raman microscope
UACH10 – High resolution transmission electron microscope
UACH11 – Power Tome Ultramicrotome
UACH12 – Precision ion polishing system GATAN
UACH13 – Precision Etching Coating System
UACH14 – Multipurpose X-ray powder diffractometer PANalytical XPertPRO MPD
UACH15 – Thermoanalytical Complet
UACH16 – High resolution Transmission electron microscope FEI Talos F200X