The presentation "A Closer Look: SEM Applications in Nanostructured Materials" will be introduced by Dr. Eirini Ioannou from Palacký University of Olomouc, Czech Republic.
The 45th NARECOM will take place on Wednesday, May 14, 2025, at 2:30. p.m.
Join Zoom Meeting: https://cesnet.zoom.us/j/92586933435
Abstract:
Scanning Electron Microscopy (SEM) is a powerful analytical technique widely used in nanomaterials science for its ability to provide high-resolution imaging and detailed surface characterization. By scanning a focused electron beam over a sample, SEM offers insights into morphology, topography, and composition with nanometer-scale precision. It is widely applied across diverse fields, including materials science, biology, electronics and nanotechnology. More specifically, in materials research, SEM is crucial for characterizing a broad range of materials such as nanocomposites, thin films, catalysts, semiconductors, polymers and metals. The versatility of SEM, enhanced by features such as Energy Dispersive X-ray Spectroscopy (EDS) for elemental analysis, makes it an essential tool for research and quality control in both academic and industrial settings.
