The presentation "Application of X-ray diffraction in material analysis" will be introduced by Dr. Josef Kašlík from Palacký University of Olomouc, Czech Advanced Technology and Research Institute, Czech Republic.
The 39th NARECOM will take place on Wednesday, October 9, 2024, at 2:30. p.m.
Join Zoom Meeting: https://cesnet.zoom.us/j/95324812514
Abstract:
X-ray diffraction (XRD) is a non-destructive powerful experimental technique with a broad range of applications in the field of material science as well as industry. XRD is based on the interaction of X-ray radiation with atoms in the matter. It can provide qualitative and quantitative information about the composition of crystalline phases, calculate crystallite size, crystal structures, and its parameters, and determine the ratio of amorphous and crystalline content. Aside, non-ambient XRD can shed light into mechanisms and kinetics of structural and phase transformations induced by elevated temperature and/or environment (like gas, pressure, etc.). The other application closely related to XRD is Small Angle X-ray Scattering (SAXS), which provides information about the size and morphology of nanoparticles. Additionally, all these analyses of powder samples can be done under inert conditions, which is especially useful in the case of non-ambient XRD – non-stable prepared materials can be transferred to the glovebox and subsequently to other characterization techniques directly without contact with air.
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